مؤتمر
Test generation for multiple-threshold gate-delay fault model
| العنوان: | Test generation for multiple-threshold gate-delay fault model |
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| المؤلفون: | Nakao, M., Kiyoshige, Y., Hatayama, K., Sato, Y., Nagumo, T. |
| المصدر: | Proceedings 10th Asian Test Symposium Asian test symposium Test Symposium, 2001. Proceedings. 10th Asian. :244-249 2001 |
| Relation: | Tenth Asian Test Symposium |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0769513786 9780769513782 |
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| تدمد: | 10817735 |
| DOI: | 10.1109/ATS.2001.990290 |