دورية أكاديمية
Fragmented High-Energy Heavy-Ion Beams for Electronics Testing
| العنوان: | Fragmented High-Energy Heavy-Ion Beams for Electronics Testing |
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| المؤلفون: | Alia, R.G., Bilko, K., Cerutti, F., Coronetti, A., Emriskova, N., Esposito, L., Pujol, F.S., Waets, A., Girard, S., Saigne, F., Durante, M., Schuy, C., Wagner, T. |
| المصدر: | IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 70(4):486-495 Apr, 2023 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 00189499 15581578 |
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| DOI: | 10.1109/TNS.2022.3210403 |