التفاصيل البيبلوغرافية
| العنوان: |
A scalable & comprehensive resilience concept against optical & physical IC backside attacks |
| المؤلفون: |
Herfurth, Norbert, Amini, Elham, Lisker, Marco, Seifert, Jean-Pierre, Boit, Christian |
| المصدر: |
2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2022 IEEE International Symposium on the. :1-6 Jul, 2022 |
| Relation: |
2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
Full Text Finder