GaAs RF Amplifier Field Failure Analysis and Reliability Prediction in 5G AAU System

التفاصيل البيبلوغرافية
العنوان: GaAs RF Amplifier Field Failure Analysis and Reliability Prediction in 5G AAU System
المؤلفون: Shi, Lin, Wang, Chong, Cai, Xiaolong, Cao, Zhengya, Ma, Xiaohua, Duan, Xiangyang
المصدر: 2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2022 IEEE International Symposium on the. :1-4 Jul, 2022
Relation: 2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781665498159
تدمد:19461550
DOI:10.1109/IPFA55383.2022.9915740