التفاصيل البيبلوغرافية
| العنوان: |
Enhanced EBAC Detection on Gate Oxide Breakdown Isolation after High Voltage Electron Beam Irradiation |
| المؤلفون: |
Ng, P. T., Rivai, F., Quah, A. C. T., Alag, J. C., Tan, P. K., Chen, C. Q. |
| المصدر: |
2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2022 IEEE International Symposium on the. :1-6 Jul, 2022 |
| Relation: |
2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
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