مؤتمر
Application of B-Scan for identification of delamination in Integrated Circuits
| العنوان: | Application of B-Scan for identification of delamination in Integrated Circuits |
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| المؤلفون: | Angelov, George, Nikolov, Dimitar, Rusev, Radostin, Rusev, Rostislav |
| المصدر: | 2022 XXXI International Scientific Conference Electronics (ET) Scientific Conference Electronics (ET), 2022 XXXI International. :1-4 Sep, 2022 |
| Relation: | 2022 XXXI International Scientific Conference Electronics (ET) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
| ردمك: | 9781665498784 |
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| DOI: | 10.1109/ET55967.2022.9920294 |