مؤتمر
Application of B-Scan for identification of delamination in Integrated Circuits
العنوان: | Application of B-Scan for identification of delamination in Integrated Circuits |
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المؤلفون: | Angelov, George, Nikolov, Dimitar, Rusev, Radostin, Rusev, Rostislav |
المصدر: | 2022 XXXI International Scientific Conference Electronics (ET) Scientific Conference Electronics (ET), 2022 XXXI International. :1-4 Sep, 2022 |
Relation: | 2022 XXXI International Scientific Conference Electronics (ET) |
قاعدة البيانات: | IEEE Xplore Digital Library |
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