Single Event Upset and Total Ionizing Dose Response of 12LP FinFET Digital Circuits

التفاصيل البيبلوغرافية
العنوان:	Single Event Upset and Total Ionizing Dose Response of 12LP FinFET Digital Circuits
المؤلفون:	Neuendank, Jereme, Spear, Matthew, Wallace, Trace, Wilson, Donald, Solano, Jose, Irumva, Gedeon, Esqueda, Ivan Sanchez, Barnaby, Hugh J., Clark, Lawrence T., Brunhaver, John, Turowski, Marek, Mikkola, Esko, Hughart, David, Young, Joshua, Manuel, Jack, Agarwal, Sapan, Vaandrager, Bastiaan, Vizkelethy, Gyorgy, Gutierrez, Amos, Trippe, James, King, Michael, Bielejec, Edward, Marinella, Matthew
المصدر:	2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC) Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC), 2022 IEEE. :1-9 Jul, 2022
Relation:	2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC)
قاعدة البيانات:	IEEE Xplore Digital Library