مؤتمر
16-Term On-Wafer Calibration with Leaky Standards and Flexible Algorithm Definition
| العنوان: | 16-Term On-Wafer Calibration with Leaky Standards and Flexible Algorithm Definition |
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| المؤلفون: | van Raay, Friedbert, Thome, Fabian, Friesicke, Christian, Lozar, Roger, Krause, Sebastian, Mikulla, Michael, Quay, Rudiger |
| المصدر: | 2022 52nd European Microwave Conference (EuMC) Microwave Conference (EuMC), 2022 52nd European. :5-8 Sep, 2022 |
| Relation: | 2022 52nd European Microwave Conference (EuMC) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
| ردمك: | 9782874870699 |
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| DOI: | 10.23919/EuMC54642.2022.9924271 |