التفاصيل البيبلوغرافية
العنوان: |
Single-Event Effects Induced by Heavy Ions in 40nm Resistive Random Access Memory |
المؤلفون: |
Yao, Kexin, Yue, Suge, Zhang, Yanlong, Wang, Liang, Li, Jiancheng, Han, Xupeng, Zha, Qichao |
المصدر: |
2022 IEEE 6th Advanced Information Technology, Electronic and Automation Control Conference (IAEAC ) Advanced Information Technology, Electronic and Automation Control Conference (IAEAC ), 2022 IEEE 6th. :1437-1441 Oct, 2022 |
Relation: |
2022 IEEE 6th Advanced Information Technology, Electronic and Automation Control Conference (IAEAC ) |
قاعدة البيانات: |
IEEE Xplore Digital Library |