Advanced wet cleaning using novel nozzle and functional ultrapure water in next generation FPD/LSI manufacturing

التفاصيل البيبلوغرافية
العنوان: Advanced wet cleaning using novel nozzle and functional ultrapure water in next generation FPD/LSI manufacturing
المؤلفون: Mitsumori, K., Nobuaki, H., Takahashi, N., Imaoka, T., Ohmi, T.
المصدر: Proceedings of ISSM2000. Ninth International Symposium on Semiconductor Manufacturing (IEEE Cat. No.00CH37130) Semiconductor manufacturing Semiconductor Manufacturing, 2000. Proceedings of ISSM 2000. The Ninth International Symposium on. :329-332 2000
Relation: Proceedings of ISSM2000. Ninth International Symposium on Semiconductor Manufacturing
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:0780373928
9780780373921
تدمد:1523553X
DOI:10.1109/ISSM.2000.993680