مؤتمر
Reliability-Improved Read Circuit and Self-Terminating Write Circuit for STT-MRAM in 16 nm FinFET
| العنوان: | Reliability-Improved Read Circuit and Self-Terminating Write Circuit for STT-MRAM in 16 nm FinFET |
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| المؤلفون: | Xue, Chang, Zhang, Yihan, Chen, Peiyu, Zhu, Mingwei, Wu, Tianqiao, Wu, Meng, He, Yandong, Ye, Le |
| المصدر: | 2022 IEEE International Symposium on Circuits and Systems (ISCAS) Circuits and Systems (ISCAS), 2022 IEEE International Symposium on. :595-599 May, 2022 |
| Relation: | 2022 IEEE International Symposium on Circuits and Systems (ISCAS) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781665484855 9781665484848 |
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| تدمد: | 21581525 |
| DOI: | 10.1109/ISCAS48785.2022.9937703 |