مؤتمر
Reliability-Improved Read Circuit and Self-Terminating Write Circuit for STT-MRAM in 16 nm FinFET
العنوان: | Reliability-Improved Read Circuit and Self-Terminating Write Circuit for STT-MRAM in 16 nm FinFET |
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المؤلفون: | Xue, Chang, Zhang, Yihan, Chen, Peiyu, Zhu, Mingwei, Wu, Tianqiao, Wu, Meng, He, Yandong, Ye, Le |
المصدر: | 2022 IEEE International Symposium on Circuits and Systems (ISCAS) Circuits and Systems (ISCAS), 2022 IEEE International Symposium on. :595-599 May, 2022 |
Relation: | 2022 IEEE International Symposium on Circuits and Systems (ISCAS) |
قاعدة البيانات: | IEEE Xplore Digital Library |
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