مؤتمر
Accurate and efficient design of experiment for reliability assessment. Application to a 20 /spl Aring/ gate oxide
| العنوان: | Accurate and efficient design of experiment for reliability assessment. Application to a 20 /spl Aring/ gate oxide |
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| المؤلفون: | Monsieur, F., Vincent, E., Roy, D., Bruyere, S., Pasqualini, F., Pananakakis, G., Ghibaudo, G. |
| المصدر: | 2001 IEEE International Integrated Reliability Workshop. Final Report (Cat. No.01TH8580) Integrated reliability workshop Integrated Reliability Workshop Final Report, 2001. 2001 IEEE International. :26-33 2001 |
| Relation: | 2001 IEEE International Integrated Reliability Workshop. Final Report |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780371674 9780780371675 |
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| DOI: | 10.1109/IRWS.2001.993912 |