مؤتمر
A Decision Tree-Based Screening Method for Improving Test Quality of Memory Chips
| العنوان: | A Decision Tree-Based Screening Method for Improving Test Quality of Memory Chips |
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| المؤلفون: | Cheng, Ya-Chi, Tan, Pai-Yu, Wu, Cheng-Wen, Shieh, Ming-Der, Chuang, Chien-Hui, Liao, Gordon |
| المصدر: | 2022 IEEE International Test Conference in Asia (ITC-Asia) ITC-ASIA Test Conference in Asia (ITC-Asia), 2022 IEEE International. :19-24 Aug, 2022 |
| Relation: | 2022 IEEE International Test Conference in Asia (ITC-Asia) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781665455237 |
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| تدمد: | 2768069X |
| DOI: | 10.1109/ITCAsia55616.2022.00014 |