التفاصيل البيبلوغرافية
| العنوان: |
III-V HBTs on 300 mm Si substrates using merged nano-ridges and its application in the study of impact of defects on DC and RF performance |
| المؤلفون: |
Vais, A., Yadav, S., Mols, Y., Vermeersch, B., Kodandarama, K. V., Baryshnikova, M., Mannaert, G., Alcotte, R., Boccardi, G., Wambacq, P., Parvais, B., Langer, R., Kunert, B., Collaert, N. |
| المصدر: |
ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC) Solid-State Device Research Conference (ESSDERC), ESSDERC 2022 - IEEE 52nd European. :261-264 Sep, 2022 |
| Relation: |
ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
