دورية أكاديمية
Machine Learning-Based Read Access Yield Estimation and Design Optimization for High-Density SRAM
العنوان: | Machine Learning-Based Read Access Yield Estimation and Design Optimization for High-Density SRAM |
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المؤلفون: | Yoon, T., Jeong, H. |
المصدر: | IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on. 42(8):2618-2630 Aug, 2023 |
قاعدة البيانات: | IEEE Xplore Digital Library |
تدمد: | 02780070 19374151 |
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DOI: | 10.1109/TCAD.2022.3225066 |