دورية أكاديمية

Machine Learning-Based Read Access Yield Estimation and Design Optimization for High-Density SRAM

التفاصيل البيبلوغرافية
العنوان: Machine Learning-Based Read Access Yield Estimation and Design Optimization for High-Density SRAM
المؤلفون: Yoon, T., Jeong, H.
المصدر: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on. 42(8):2618-2630 Aug, 2023
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
تدمد:02780070
19374151
DOI:10.1109/TCAD.2022.3225066