Low peel strength investigation in direct gold System in Package module

التفاصيل البيبلوغرافية
العنوان: Low peel strength investigation in direct gold System in Package module
المؤلفون: Lo, Tsung Nan, Liu, Wei, Macatangay, Aldy, Molla, Jaynal, Hiew, Pey Fang
المصدر: 2022 IEEE 39th International Electronics Manufacturing Technology Conference (IEMT) Electronics Manufacturing Technology Conference (IEMT), 2022 IEEE 39th International. :1-4 Oct, 2022
Relation: 2022 IEEE 39th International Electronics Manufacturing Technology Conference (IEMT)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781665471701
DOI:10.1109/IEMT55343.2022.9969472