A methodology for defect detection in analog circuits based on causal feature selection

التفاصيل البيبلوغرافية
العنوان: A methodology for defect detection in analog circuits based on causal feature selection
المؤلفون: Leger, G., Gines, A., Gutierrez, V., Barragan, M. J.
المصدر: 2022 29th IEEE International Conference on Electronics, Circuits and Systems (ICECS) Electronics, Circuits and Systems (ICECS), 2022 29th IEEE International Conference on. :1-4 Oct, 2022
Relation: 2022 29th IEEE International Conference on Electronics, Circuits and Systems (ICECS)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781665488235
DOI:10.1109/ICECS202256217.2022.9970932