التفاصيل البيبلوغرافية
العنوان: |
Effect of Oxygen plasma treatment on the performance of GaN-based MIS-HEMTs |
المؤلفون: |
Sekiyama, K., Ishiguro, M., Yamazaki, S., Urano, S., Baratov, A., Asubar, J. T., Kuzuhara, M. |
المصدر: |
2022 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK) Future of Electron Devices, Kansai (IMFEDK), 2022 IEEE International Meeting for. :1-3 Nov, 2022 |
Relation: |
2022 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK) |
قاعدة البيانات: |
IEEE Xplore Digital Library |