مؤتمر
Scan-Based Test Chip Design with XOR-based C-testable Functional Blocks
| العنوان: | Scan-Based Test Chip Design with XOR-based C-testable Functional Blocks |
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| المؤلفون: | Chen, Yan-Fu, Kang, Duo-Yao, Lee, Kuen-Jong |
| المصدر: | 2022 IEEE International Test Conference (ITC) ITC Test Conference (ITC), 2022 IEEE International. :82-91 Sep, 2022 |
| Relation: | 2022 IEEE International Test Conference (ITC) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781665462709 |
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| تدمد: | 23782250 |
| DOI: | 10.1109/ITC50671.2022.00015 |