مؤتمر
Improving Test Quality of Memory Chips by a Decision Tree-Based Screening Method
| العنوان: | Improving Test Quality of Memory Chips by a Decision Tree-Based Screening Method |
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| المؤلفون: | Cheng, Ya-Chi, Tan, Pai-Yu, Wu, Cheng-Wen, Shieh, Ming-Der, Chuang, Chien-Hui, Liao, Gordon |
| المصدر: | 2022 IEEE International Test Conference (ITC) ITC Test Conference (ITC), 2022 IEEE International. :601-608 Sep, 2022 |
| Relation: | 2022 IEEE International Test Conference (ITC) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781665462709 |
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| تدمد: | 23782250 |
| DOI: | 10.1109/ITC50671.2022.00080 |