دورية أكاديمية
Advantage of In-situ over Ex-situ techniques as reliability tool: Aging kinetics of Imec’s MCM-D discrete passives devices.
| العنوان: | Advantage of In-situ over Ex-situ techniques as reliability tool: Aging kinetics of Imec’s MCM-D discrete passives devices. |
|---|---|
| المؤلفون: | Soussan, P., Lekens, G., Dreesen, R., De Ceuninck, W., Beyne, E. |
| المصدر: | In Microelectronics Reliability 2003 43(9):1785-1790 |
| قاعدة البيانات: | ScienceDirect |
Full Text Finder | تدمد: | 00262714 |
|---|---|
| DOI: | 10.1016/S0026-2714(03)00301-9 |