دورية أكاديمية
Hot carrier reliability of RF N- LDMOS for S Band radar application
| العنوان: | Hot carrier reliability of RF N- LDMOS for S Band radar application |
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| المؤلفون: | Gares, M., Maanane, H., Masmoudi, M., Bertram, P., Marcon, J., Belaid, M.A., Mourgues, K., Tolant, C., Eudeline, P. |
| المصدر: | In Microelectronics Reliability 2006 46(9):1806-1811 |
| قاعدة البيانات: | ScienceDirect |
Full Text Finder | تدمد: | 00262714 |
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| DOI: | 10.1016/j.microrel.2006.07.074 |