دورية أكاديمية
Leakage current study and relevant defect localization in integrated circuit failure analysis
| العنوان: | Leakage current study and relevant defect localization in integrated circuit failure analysis |
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| المؤلفون: | Wu, Chunlei, Yao, Suying, Corinne, Bergès |
| المصدر: | In Microelectronics Reliability February-March 2015 55(3-4):463-469 |
| قاعدة البيانات: | ScienceDirect |
Full Text Finder | تدمد: | 00262714 |
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| DOI: | 10.1016/j.microrel.2015.01.005 |