دورية أكاديمية
Leakage current study and relevant defect localization in integrated circuit failure analysis
العنوان: | Leakage current study and relevant defect localization in integrated circuit failure analysis |
---|---|
المؤلفون: | Wu, Chunlei, Yao, Suying, Corinne, Bergès |
المصدر: | In Microelectronics Reliability February-March 2015 55(3-4):463-469 |
قاعدة البيانات: | ScienceDirect |
تدمد: | 00262714 |
---|---|
DOI: | 10.1016/j.microrel.2015.01.005 |