دورية أكاديمية
Physically-based extraction methodology for accurate MOSFET degradation assessment
| العنوان: | Physically-based extraction methodology for accurate MOSFET degradation assessment |
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| المؤلفون: | Torrente, Giulio, Coignus, Jean, Renard, Sophie, Vernhet, Alexandre, Reimbold, Gilles, Roy, David, Ghibaudo, Gerard |
| المصدر: | In Microelectronics Reliability August-September 2015 55(9-10):1417-1421 |
| قاعدة البيانات: | ScienceDirect |
Full Text Finder | تدمد: | 00262714 |
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| DOI: | 10.1016/j.microrel.2015.06.063 |