دورية أكاديمية
Effect of OFF-state stress on reliability of nMOSFET in SWD circuits of DRAM
| العنوان: | Effect of OFF-state stress on reliability of nMOSFET in SWD circuits of DRAM |
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| المؤلفون: | Kim, Jongkyun, Lee, Namhyun, Kim, Gang-Jun, Lee, Young-Yun, Seok, Jungeun, Lee, Yunsung |
| المصدر: | In Microelectronics Reliability September 2018 88-90:183-185 |
| قاعدة البيانات: | ScienceDirect |
Full Text Finder | تدمد: | 00262714 |
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| DOI: | 10.1016/j.microrel.2018.06.101 |