دورية أكاديمية
S-band pulsed-RF operating life test on AlGaN/GaN HEMT devices for radar application
العنوان: | S-band pulsed-RF operating life test on AlGaN/GaN HEMT devices for radar application |
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المؤلفون: | Moultif, N. *, Latry, O. *, Ndiaye, M., Neveu, T., Joubert, E., Moreau, C., Goupy, J-F. |
المصدر: | In Microelectronics Reliability September 2019 100-101 |
قاعدة البيانات: | ScienceDirect |
تدمد: | 00262714 |
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DOI: | 10.1016/j.microrel.2019.113434 |