دورية أكاديمية
Single event transient sensitivity analysis of different 32 nm CMOS majority voters designs
| العنوان: | Single event transient sensitivity analysis of different 32 nm CMOS majority voters designs |
|---|---|
| المؤلفون: | Oliveira, I.F.V., Schvittz, R.B., Butzen, P.F. |
| المصدر: | In Microelectronics Reliability September 2019 100-101 |
| قاعدة البيانات: | ScienceDirect |
Full Text Finder | تدمد: | 00262714 |
|---|---|
| DOI: | 10.1016/j.microrel.2019.06.061 |