دورية أكاديمية
Single event transient sensitivity analysis of different 32 nm CMOS majority voters designs
العنوان: | Single event transient sensitivity analysis of different 32 nm CMOS majority voters designs |
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المؤلفون: | Oliveira, I.F.V., Schvittz, R.B., Butzen, P.F. |
المصدر: | In Microelectronics Reliability September 2019 100-101 |
قاعدة البيانات: | ScienceDirect |
تدمد: | 00262714 |
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DOI: | 10.1016/j.microrel.2019.06.061 |