دورية أكاديمية
Novel failure traces beyond the barrier on the floating device
العنوان: | Novel failure traces beyond the barrier on the floating device |
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المؤلفون: | Lee, Gwang Wook, Shim, Sunnu, Cho, Wookhyun, Kim, Wonse, Lee, Kisoo, Kim, Jaehyun, Cho, Seongjun, Won, Seokjun, Koo, Bonyoung |
المصدر: | In Microelectronics Reliability November 2020 114 |
قاعدة البيانات: | ScienceDirect |
تدمد: | 00262714 |
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DOI: | 10.1016/j.microrel.2020.113874 |