دورية أكاديمية
Ageing of glass passivated TRIAC devices under thermal and electrical stress
| العنوان: | Ageing of glass passivated TRIAC devices under thermal and electrical stress |
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| المؤلفون: | Buvat, Y., Bouyssou, E., Morillon, B., Gautier, G. |
| المصدر: | In Microelectronics Reliability November 2020 114 |
| قاعدة البيانات: | ScienceDirect |
Full Text Finder | تدمد: | 00262714 |
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| DOI: | 10.1016/j.microrel.2020.113767 |