دورية أكاديمية
Deep learning-based image analysis framework for hardware assurance of digital integrated circuits
| العنوان: | Deep learning-based image analysis framework for hardware assurance of digital integrated circuits |
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| المؤلفون: | Lin, Tong, Shi, Yiqiong, Shu, Na, Cheng, Deruo, Hong, Xuenong, Song, Jingsi, Gwee, Bah Hwee |
| المصدر: | In Microelectronics Reliability August 2021 123 |
| قاعدة البيانات: | ScienceDirect |
Full Text Finder | تدمد: | 00262714 |
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| DOI: | 10.1016/j.microrel.2021.114196 |