دورية أكاديمية
Synergistic effects of heating and biasing of AlGaN/GaN high electron mobility transistors: An in-situ transmission electron microscopy study
| العنوان: | Synergistic effects of heating and biasing of AlGaN/GaN high electron mobility transistors: An in-situ transmission electron microscopy study |
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| المؤلفون: | Al-Mamun, Nahid Sultan, Islam, Ahmad, Glavin, Nicholas, Haque, Aman, Wolfe, Douglas E., Ren, Fan, Pearton, Stephen |
| المصدر: | In Microelectronics Reliability September 2024 160 |
| قاعدة البيانات: | ScienceDirect |
Full Text Finder | تدمد: | 00262714 |
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| DOI: | 10.1016/j.microrel.2024.115470 |