دورية أكاديمية
Kapitza conductance of Bi/sapphire interface studied by depth- and time-resolved X-ray diffraction
| العنوان: | Kapitza conductance of Bi/sapphire interface studied by depth- and time-resolved X-ray diffraction |
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| المؤلفون: | Sheu, Y.M., Trigo, M., Chien, Y.J., Uher, C., Arms, D.A., Peterson, E.R., Walko, D.A., Landahl, E.C., Chen, J., Ghimire, S., Reis, D.A. |
| المصدر: | In Solid State Communications 2011 151(11):826-829 |
| قاعدة البيانات: | ScienceDirect |
Full Text Finder | تدمد: | 00381098 |
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| DOI: | 10.1016/j.ssc.2011.03.022 |