دورية أكاديمية
Ohmic contact characterization of AlGaN/GaN device layers with spatially localized LEEN spectroscopy
| العنوان: | Ohmic contact characterization of AlGaN/GaN device layers with spatially localized LEEN spectroscopy |
|---|---|
| المؤلفون: | Jessen, G.H, White, B.D, Bradley, S.T, Smith, P.E, Brillson, L.J, Van Nostrand, J.E, Fitch, R, Via, G.D, Gillespie, J.K, Dettmer, R.W, Sewell, J.S |
| المصدر: | In Solid State Electronics 2002 46(9):1427-1431 |
| قاعدة البيانات: | ScienceDirect |
Full Text Finder | تدمد: | 00381101 |
|---|---|
| DOI: | 10.1016/S0038-1101(02)00075-8 |