دورية أكاديمية
Analytic modeling of breakdown voltage shift in the CMOS buried multiple junction detector
| العنوان: | Analytic modeling of breakdown voltage shift in the CMOS buried multiple junction detector |
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| المؤلفون: | Vidal de Negreiros da Silva, Thais Luana, Kleimann, Pascal, Pittet, Patrick, Lu, Guo-Neng |
| المصدر: | In Solid State Electronics February 2020 164 |
| قاعدة البيانات: | ScienceDirect |
Full Text Finder | تدمد: | 00381101 |
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| DOI: | 10.1016/j.sse.2019.107682 |