دورية أكاديمية
Analytic modeling of breakdown voltage shift in the CMOS buried multiple junction detector
العنوان: | Analytic modeling of breakdown voltage shift in the CMOS buried multiple junction detector |
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المؤلفون: | Vidal de Negreiros da Silva, Thais Luana, Kleimann, Pascal, Pittet, Patrick, Lu, Guo-Neng |
المصدر: | In Solid State Electronics February 2020 164 |
قاعدة البيانات: | ScienceDirect |
تدمد: | 00381101 |
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DOI: | 10.1016/j.sse.2019.107682 |