دورية أكاديمية
A physical and versatile aging compact model for hot carrier degradation in SiGe HBTs under dynamic operating conditions
| العنوان: | A physical and versatile aging compact model for hot carrier degradation in SiGe HBTs under dynamic operating conditions |
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| المؤلفون: | Mukherjee, C., Marc, F., Couret, M., Fischer, G.G., Jaoul, M., Céli, D., Aufinger, K., Zimmer, T., Maneux, C. |
| المصدر: | In Solid State Electronics January 2020 163 |
| قاعدة البيانات: | ScienceDirect |
Full Text Finder | تدمد: | 00381101 |
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| DOI: | 10.1016/j.sse.2019.107635 |