دورية أكاديمية
Investigating interface states and oxide traps in the MoS2/oxide/Si system
| العنوان: | Investigating interface states and oxide traps in the MoS2/oxide/Si system |
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| المؤلفون: | Coleman, E., Mirabelli, G., Bolshakov, P., Zhao, P., Caruso, E., Gity, F., Monaghan, S., Cherkaoui, K., Balestra, V., Wallace, R.M., Young, C.D., Duffy, R., Hurley, P.K. |
| المصدر: | In Solid State Electronics December 2021 186 |
| قاعدة البيانات: | ScienceDirect |
Full Text Finder | تدمد: | 00381101 |
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| DOI: | 10.1016/j.sse.2021.108123 |