دورية أكاديمية
Sensitivity enhancement in OCD metrology by optimizing azimuth angle based on the RCWA simulation
العنوان: | Sensitivity enhancement in OCD metrology by optimizing azimuth angle based on the RCWA simulation |
---|---|
المؤلفون: | Choi, Hyunsuk, Lee, Kwangseok, Doh, Jiseong, Jeong, Jaehoon, Kwag, Taeshin, Kim, Minseok, Kim, Yeonjeong, Kim, Jongchul, Yoo, Hyung Keun, Kim, Dae Sin |
المصدر: | In Solid State Electronics February 2023 200 |
قاعدة البيانات: | ScienceDirect |
كن أول من يترك تعليقا!