التفاصيل البيبلوغرافية
العنوان: |
Digital pixel test structures implemented in a 65 nm CMOS process |
المؤلفون: |
Aglieri Rinella, Gianluca, Andronic, Anton, Antonelli, Matias, Aresti, Mauro, Baccomi, Roberto, Becht, Pascal, Beole, Stefania, Braach, Justus, Buckland, Matthew Daniel, Buschmann, Eric, Camerini, Paolo, Carnesecchi, Francesca, Cecconi, Leonardo, Charbon, Edoardo, Contin, Giacomo, Dannheim, Dominik, de Melo, Joao, Deng, Wenjing, di Mauro, Antonello, Hasenbichler, Jan, Hillemanns, Hartmut, Hong, Geun Hee, Isakov, Artem, Junique, Antoine, Kluge, Alex, Kotliarov, Artem, Křížek, Filip, Lautner, Lukas, Mager, Magnus, Marras, Davide, Martinengo, Paolo, Masciocchi, Silvia, Menzel, Marius Wilm, Munker, Magdalena, Piro, Francesco, Rachevski, Alexandre, Rebane, Karoliina, Reidt, Felix, Russo, Roberto, Sanna, Isabella, Sarritzu, Valerio, Senyukov, Serhiy, Snoeys, Walter, Sonneveld, Jory, Šuljić, Miljenko, Svihra, Peter, Tiltmann, Nicolas, Usai, Gianluca, Van Beelen, Jacob Bastiaan, Vassilev, Mirella Dimitrova, Vernieri, Caterina, Villani, Anna |
المصدر: |
In Nuclear Inst. and Methods in Physics Research, A November 2023 1056 |
قاعدة البيانات: |
ScienceDirect |