دورية أكاديمية
Layer-by-layer characterization of ultrathin films with secondary ion mass spectrometry
| العنوان: | Layer-by-layer characterization of ultrathin films with secondary ion mass spectrometry |
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| المؤلفون: | Li, Z., Rickman, R.D., Verkhoturov, S.V., Schweikert, E.A. |
| المصدر: | In Applied Surface Science 2004 231:328-331 |
| قاعدة البيانات: | ScienceDirect |
Full Text Finder | تدمد: | 01694332 |
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| DOI: | 10.1016/j.apsusc.2004.03.081 |