دورية أكاديمية
Chemical characterization by XPS of Cu/Ge ohmic contacts to n-GaAs
| العنوان: | Chemical characterization by XPS of Cu/Ge ohmic contacts to n-GaAs |
|---|---|
| المؤلفون: | López, M.C., Galiana, B., Algora, C., Rey-Stolle, I., Gabas, M., Ramos-Barrado, J.R. |
| المصدر: | In Applied Surface Science 2007 253(11):5062-5066 |
| قاعدة البيانات: | ScienceDirect |
Full Text Finder | تدمد: | 01694332 |
|---|---|
| DOI: | 10.1016/j.apsusc.2006.11.013 |