دورية أكاديمية
Reliability study on deep-ultraviolet photodetectors based on ZnGa2O4 epilayers grown by MOCVD
| العنوان: | Reliability study on deep-ultraviolet photodetectors based on ZnGa2O4 epilayers grown by MOCVD |
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| المؤلفون: | Horng, Ray-Hua, Huang, Peng-Hsuan, Li, Yun-Sheng, Tarntair, Fu-Gow, Tan, Chih Shan |
| المصدر: | In Applied Surface Science 30 July 2021 555 |
| قاعدة البيانات: | ScienceDirect |
Full Text Finder | تدمد: | 01694332 |
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| DOI: | 10.1016/j.apsusc.2021.149657 |