دورية أكاديمية
XPS, ToF SIMS and wettability analyses on Ni surfaces after Ar-H2 RF plasma treatment: An efficient and optimized plasma treatment approach
| العنوان: | XPS, ToF SIMS and wettability analyses on Ni surfaces after Ar-H2 RF plasma treatment: An efficient and optimized plasma treatment approach |
|---|---|
| المؤلفون: | Vivet, L., Benoit, R., Falzon, M.F., Tan, K.-L., Dorairaj, D., Morelle, J.-M. |
| المصدر: | In Surface & Coatings Technology 25 September 2020 398 |
| قاعدة البيانات: | ScienceDirect |
Full Text Finder | تدمد: | 02578972 |
|---|---|
| DOI: | 10.1016/j.surfcoat.2020.126094 |