دورية أكاديمية
In-situ X-ray diffraction on functional thin films using a laboratory source during electrical biasing
| العنوان: | In-situ X-ray diffraction on functional thin films using a laboratory source during electrical biasing |
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| المؤلفون: | Allouche, B., Gueye, I., Rhun, G. Le, Gergaud, P., Vaxelaire, N. |
| المصدر: | In Materials & Design 15 September 2018 154:340-346 |
| قاعدة البيانات: | ScienceDirect |
Full Text Finder | تدمد: | 02641275 |
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| DOI: | 10.1016/j.matdes.2018.05.016 |