دورية أكاديمية
Assessment of the strain depth sensitivity of Moiré sampling Scanning Transmission Electron Microscopy Geometrical Phase Analysis through a comparison with Dark-Field Electron Holography
| العنوان: | Assessment of the strain depth sensitivity of Moiré sampling Scanning Transmission Electron Microscopy Geometrical Phase Analysis through a comparison with Dark-Field Electron Holography |
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| المؤلفون: | Pofelski, A., Whabi, V., Ghanad-Tavakoli, S., Botton, G. |
| المصدر: | In Ultramicroscopy April 2021 223 |
| قاعدة البيانات: | ScienceDirect |
Full Text Finder | تدمد: | 03043991 |
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| DOI: | 10.1016/j.ultramic.2021.113225 |