دورية أكاديمية

A concise subspace projection based meta-learning method for fast modeling and monitoring in multi-grade semiconductor process

التفاصيل البيبلوغرافية
العنوان: A concise subspace projection based meta-learning method for fast modeling and monitoring in multi-grade semiconductor process
المؤلفون: Liu, Jingxiang, Zhu, Weimin, Mu, Guoqing, Chen, Chun-I, Chen, Junghui
المصدر: In Computers & Industrial Engineering February 2024 188
قاعدة البيانات: ScienceDirect
الوصف
تدمد:03608352
DOI:10.1016/j.cie.2024.109914