دورية أكاديمية
Sample-imbalanced wafer map defects classification based on auxiliary classifier denoising diffusion probability model
| العنوان: | Sample-imbalanced wafer map defects classification based on auxiliary classifier denoising diffusion probability model |
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| المؤلفون: | Li, Jialin, Tao, Ran, Chen, Renxiang, Chen, Yongpeng, Zhao, Chengying, Huang, Xianzhen |
| المصدر: | In Computers & Industrial Engineering June 2024 192 |
| قاعدة البيانات: | ScienceDirect |
Full Text Finder | تدمد: | 03608352 |
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| DOI: | 10.1016/j.cie.2024.110209 |