دورية أكاديمية
LEEM and XPEEM studies of C-AFM induced surface modifications of thermally grown SiO 2
| العنوان: | LEEM and XPEEM studies of C-AFM induced surface modifications of thermally grown SiO 2 |
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| المؤلفون: | Heun, S. *, Kremmer, S., Ercolani, D., Wurmbauer, H., Teichert, C. |
| المصدر: | In Journal of Electron Spectroscopy and Related Phenomena 2005 144:1163-1166 |
| قاعدة البيانات: | ScienceDirect |
Full Text Finder | تدمد: | 03682048 |
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| DOI: | 10.1016/j.elspec.2005.01.170 |