دورية أكاديمية
Structural and electronic analysis of Hf on Si(1 1 1) surface studied by XPS, LEED and XPD
| العنوان: | Structural and electronic analysis of Hf on Si(1 1 1) surface studied by XPS, LEED and XPD |
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| المؤلفون: | Carazzolle, M.F., Schürmann, M., Flüchter, C.R., Weier, D., Berges, U., de Siervo, A., Landers, R., Kleiman, G.G., Westphal, C. |
| المصدر: | In Journal of Electron Spectroscopy and Related Phenomena 2007 156:393-397 |
| قاعدة البيانات: | ScienceDirect |
Full Text Finder | تدمد: | 03682048 |
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| DOI: | 10.1016/j.elspec.2006.12.062 |